%0 Journal Article %J Metrologia %D 2006 %T Statistical analysis for multiple artifact problem in key comparisons with linear trends %A Zhang, N.-F. %A Strawderman, W. %A Liu, H.-k. %A Sedransk, N. %K computational physics %K instrumentation and measurement %X

A statistical analysis for key comparisons with linear trends and multiple artefacts is proposed. This is an extension of a previous paper for a single artefact. The approach has the advantage that it is consistent with the no-trend case. The uncertainties for the key comparison reference value and the degrees of equivalence are also provided. As an example, the approach is applied to key comparison CCEM–K2.

%B Metrologia %V 43 %P 21-26 %G eng %R 10.1088/0026-1394/43/1/003