<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Zhang, N.-F.</style></author><author><style face="normal" font="default" size="100%">Strawderman, W.</style></author><author><style face="normal" font="default" size="100%">Liu, H.-k.</style></author><author><style face="normal" font="default" size="100%">Sedransk, N.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Statistical analysis for multiple artifact problem in key comparisons with linear trends</style></title><secondary-title><style face="normal" font="default" size="100%">Metrologia</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">computational physics</style></keyword><keyword><style  face="normal" font="default" size="100%">instrumentation and measurement</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2006</style></year></dates><volume><style face="normal" font="default" size="100%">43</style></volume><pages><style face="normal" font="default" size="100%">21-26</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;A statistical analysis for key comparisons with linear trends and multiple artefacts is proposed. This is an extension of a previous paper for a single artefact. The approach has the advantage that it is consistent with the no-trend case. The uncertainties for the key comparison reference value and the degrees of equivalence are also provided. As an example, the approach is applied to key comparison CCEM–K2.&lt;/p&gt;
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